ON THE INHERENT NOISE OF AN IDEAL TWO-PORT ISOLATORSUTHERLAND AD.1982; IEEE TRANS. MICROWAVE THEORY TECH.; ISSN 0018-9480; USA; DA. 1982; VOL. 30; NO 5; PP. 830-832; BIBL. 2 REF.Article

ELECTRIC FIELD DEPENDENCE OF MOBILITY FLUCTUATION 1/F NOISE IN ELEMENTAL SEMICONDUCTORSJINDAL RP; VAN DER ZIEL A.1981; SOLID-STATE ELECTRON.; ISSN 0038-1101; GBR; DA. 1981; VOL. 24; NO 10; PP. 983-984; BIBL. 5 REF.Article

EXCESS NOISE AND REFIRING PROCESSES IN THICK-FILM RESISTORSPRUDENZIATI M; MORTEN B; MASOERO A et al.1981; J. PHYS. D; ISSN 0022-3727; GBR; DA. 1981; VOL. 14; NO 7; PP. 1355-1362; BIBL. 9 REF.Article

AN ALTERNATE WAY OF LOOKING AT MASER NOISEVAN DER ZIEL A.1982; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 4; PP. 2783-2784; BIBL. 8 REF.Article

NOISE EQUIVALENT CIRCUIT OF A SEMICONDUCTOR LASER DIODEHARDER C; KATZ J; MARGALIT S et al.1982; IEEE J. QUANTUM ELECTRON.; ISSN 0018-9197; USA; DA. 1982; VOL. 18; NO 3; PP. 333-337; BIBL. 13 REF.Article

NOISE SMOOTHING IN IMAGE IMPROVEMENTKOZIMA K; UCHIDA S.1982; OPT.-ACTA; ISSN 0030-3909; GBR; DA. 1982; VOL. 29; NO 4; PP. 371-376; BIBL. 9 REF.Conference Paper

RECEPTION QUASI-OPTIMUM DE SIGNAUX AVEC DU BRUITMAZOR YU L.1982; IZV. VYSS. UCEBN. ZAVED., RADIOELEKTRON.; ISSN 0021-3470; SUN; DA. 1982; VOL. 25; NO 4; PP. 36-43; BIBL. 6 REF.Article

DIGITALE BILDVERBESSERUNG VON VERRAUSCHTEN ABTASTERDATEN = RENFORCEMENT DU CONTRASTE DES IMAGES NUMERIQUES DANS LES IMAGES SCANNEREHLERS M; LOHMANN P.1982; BILDMESS. LUFTBILDWES.; ISSN 0006-2421; DEU; DA. 1982; VOL. 50; NO 5; PP. 161-171; ABS. ENG/FRE; BIBL. 10 REF.Article

THEORY OF TRANSPORT NOISE IN SEMICONDUCTORSVAN VLIET KM; MEHTA H.1981; PHYS. STATUS SOLIDI (B), BASIC RES.; ISSN 0370-1972; DDR; DA. 1981; VOL. 106; NO 1; PP. 11-30; BIBL. 30 REF.Article

CONDITIONS DE CONVEXITE DES CARACTERISTIQUES GENERALISEES DES DISPOSITIFS RESOLVANTS LORS DU CONTROLE DE LA FIABILITE D'UNE RECEPTION DE SIGNAUX SUR UN FOND DE BRUITSSINDLER YU B.1982; RADIOTEKH. I ELEKTRON.; SUN; DA. 1982; VOL. 27; NO 3; PP. 438-446; BIBL. 17 REF.Article

ON MOBILITY FLUCTUATIONS IN L/F NOISEVAN VLIET KM; ZIJLSTRA RJJ.1981; PHYSICA B+C; ISSN 0378-4363; NLD; DA. 1981; VOL. 111; NO 2-3; PP. 321-322; BIBL. 5 REF.Article

NOISE CHARACTERISTIC OF HELIUM-CADMIUM LASERCHIU MS; TSENG YG.1982; J. APPL. PHYS.; ISSN 0021-8979; USA; DA. 1982; VOL. 53; NO 3; PART. 1; PP. 1797-1799; BIBL. 8 REF.Article

ROUNDOFF NOISE INVARIANTS IN NORMAL DIGITAL FILTERSBARNES CW; MIYAWAKI T.1982; IEEE TRANS. CIRCUITS SYST.; ISSN 0098-4094; USA; DA. 1982; VOL. 29; NO 4; PP. 251-256; BIBL. 15 REF.Article

GRUNDBEGRIFFE DER UEBERTRAGUNGSTECHNIK (16) = NOTIONS FONDAMENTALES RELATIVES AUX TECHNIQUES DE TRANSMISSION (16)HESSELMANN W; LOHNERT C.1982; EP, EISENBAHNTECH. PRAX; ISSN 0013-2837; DEU; DA. 1982; VOL. 34; NO 2; PP. 17-18Article

EXPERIMENTAL STUDY OF NOISE GENERATED BY MAGNETRONS FOR MICROWAVE OVENSYAMAMOTO K; KURONUMA H; KOINUMA T et al.1981; J. MICROWAVE POWER; ISSN 0022-2739; CAN; DA. 1981; VOL. 16; NO 3-4; PP. 271-276; BIBL. 8 REF.Article

NOISE CHARACTERISTICS IN LINE-NARROWED SEMICONDUCTOR LASERS WITH OPTICAL FEEDBACKGOLDBERG L; DANDRIDGE A; MILES RO et al.1981; ELECTRON. LETT.; ISSN 0013-5194; GBR; DA. 1981; VOL. 17; NO 19; PP. 677-678; BIBL. 11 REF.Article

NATURE DU BRUIT EN 1/FSHUL'MAN A YA.1981; Z. EKSP. TEOR. FIZ.; ISSN 0044-4510; SUN; DA. 1981; VOL. 81; NO 2; PP. 784-797; ABS. ENG; BIBL. 17 REF.Article

NOISE MEASUREMENTS ON PHOTO AVALANCHE DIODESGONG J; VAN VLIET KM; SUTHERLAND AD et al.1981; PHYS. STATUS SOLIDI (A), APPL. RES.; ISSN 0031-8965; DDR; DA. 1981; VOL. 63; NO 2; PP. 445-460; ABS. GER; BIBL. 16 REF.Article

THE INFLUENCE OF SPACE-CHARGE ON THE SHOT NOISE IN TEMPERATURE-LIMITED PLANAR DIODESBECK AH; WANG DA.1982; INT. J. ELECTRON. THEOR. EXP.; ISSN 0020-7217; GBR; DA. 1982; VOL. 53; NO 2; PP. 163-169; BIBL. 1 REF.Article

EINE 125-DB-VERGLEICHSSCHALLQUELLE FUER AKUSTISCHE MESSAUFGABEN UNTER HOHEM STOERGERAUESCHPEGEL = SOURCE DE SON DE REFERENCE DE 125 DB POUR DES PROBLEMES DE MESURES ACOUSTIQUES SOUS UN NIVEAU DE BRUIT DE FOND ELEVEECKER W; ZINECKER R.1982; MESS. + PRUEF.; ISSN 0026-0339; DEU; DA. 1982; NO 5; PP. 300-308; 6 P.; BIBL. 19 REF.Article

SIMULATION VON DIGITALFILTERN = SIMULATION DE FILTRES NUMERIQUESBUCHHOLZ G.1982; NACHRICHTENTECH., ELEKTRON.; ISSN 0323-4657; DDR; DA. 1982; VOL. 32; NO 2; PP. 60-62; ABS. RUS/ENG; BIBL. 2 REF.Article

BRUITS DE LUMINESCENCE DANS DES DIODES LUMINESCENTES AU GAL A 2 BANDESPOTEMKIN VV; MAMONTOV YU M.1982; IZV. VYSS. NCEBN. ZAVED., RADIOFIZ.; ISSN 0021-3462; SUN; DA. 1982; VOL. 25; NO 4; PP. 461-465; ABS. ENG; BIBL. 5 REF.Article

NOISE IN AN ALGAAS SEMICONDUCTOR LASER AMPLIFIERMUKAI T; YAMAMOTO Y.1982; IEEE J. QUANTUM ELECTRON.; ISSN 0018-9197; USA; DA. 1982; VOL. 18; NO 4; PP. 564-575; BIBL. 25 REF.Article

PARAMETER FLUCTUATIONS AND LOW FREQUENCY NOISE IN JOSEPHSON JUNCTION DEVICESTESCHE CD.1982; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1982; VOL. 41; NO 1; PP. 99-100; BIBL. 8 REF.Article

RECURSIVE KALMAN WINDOW APPROACH TO IMAGE RESTORATIONDIKSHIT SS.1982; IEEE TRANS. ACOUST. SPEECH SIGNAL PROCESS.; ISSN 0096-3518; USA; DA. 1982; VOL. 30; NO 2; PP. 125-140; BIBL. 16 REF.Article